| Company Name | Micron Semiconductor Asia Operations Pte Ltd |
|---|---|
| Company UEN | 201815216Z |
Responsibilities: • Perform cross-section analysis and Scanning Electron Microscopy (SEM) inspection for process health monitoring. • Handle Transmission Electron Microscopy (TEM) sample preparation using Focus Ion Beam (FIB) for TEM inspection. • Identify defects and failure mechanism through physical failure analysis using various sample de-processing techniques and wide range of failure analysis equipment. • Perform physical fault isolation techniques.
Requirements: • Diploma in Electrical/Electronics/Microelectronics/Mechatronics Engineering or any related field. • Experience in Real-Time Defect Analysis (RDA) or Failure Analysis related areas will be helpful! • Able to work on permanent 12-hour shift.
| Job Title | Technologist - PIE Yield Enhancement |
|---|---|
| Salary | SGD2,200.00 - 3,200.00 |
| Employment Type | Full Time |
| Working Experience | 0 Years |
| Qualification | Post Graduate Diploma / Certificate |