| Company Name | Micron Semiconductor Asia Operations Pte Ltd |
|---|---|
| Company UEN | 201815216Z |
Perform cross-section analysis and SEM inspection for process health monitoring. Handle TEM sample preparation using Focus Ion Beam (FIB) for TEM inspection. Identify defects and failure mechanism through physical failure analysis using various sample de-processing techniques and wide range of failure analysis equipments. Perform physical fault isolation techniques.
Equivalent experience in wafer fab Able to work permanent 12 hours shift Experience in RDA/Failure Analysis related areas will be helpful Engineering or Science Technology Engineering Mathematics background
| Job Title | Technologist - PIE Yield Enhancement |
|---|---|
| Salary | SGD2,000.00 - 2,800.00 |
| Employment Type | Full Time |
| Working Experience | 0 Years |